Daniel N. Beshers

Professor Emeritus Metallurgy, H. Krumb School of Mines; Special Lecturer in Earth and Environmental Engineering

Materials Science and Engineering
(office) 289A Engineering Terrace
(mai) 200 S.W. Mudd
Mail Code: 4701
New York, NY 10027
Email: dnb4@columbia.edu

Research Specialty

Mechanical properties, especially losses of energy in dynamic processes
Magnetic hysteresis losses and magnetomechanical damping
Interstitial impurities


University of Illinois, Ph.D. (Physics) 1956

University of Illinois, M.S. (Physics) 1951

Swarthmore College, B.A. (Mathematics) 1949

Publications (Highilghts)

"Eddy Current Damping Revisited", Materials Science and Engineering A, vol 521-522, pp 190-193 (2009)

D. N. Beshers, G. B. Vunni, "Topological Hysteresis as a Model for Rayleigh Damping", Materials Science and Engineering A442,191-194 (2006) (with G. B. Vunni)

D. N. Beshers, R. J. Seymour, "Effects of proximity on mis-matched composites", Materials Science and Engineering A409, 211-216 (2005)

D. N. Beshers, G. B. Vunni, V. F. Coronel, "Anharmonic aspects of magnetomechanical damping", Materials Science and Engineering, A370, 352-355 (2004)

D. N. Beshers, "Microeddy Current Damping", Journal of Alloys and Compounds 310, 165-168 (2000)

D. N. Beshers, "Nickel-titanium Alloys: Stress-related temperature transitional range", American Journal of Orthodontics and Dentofacial Orthopedics 118, 685-692 (2000) (with M. Santoro)

D. N. Beshers, "Magnetomechanical damping at low temperature," J. Phys. IV, Colloq. (France), 6 no. 8. 523 (1996)

D. N. Beshers, "Internal stress: measures by mobility of Bloch walls and dislocations," Micromechanics of Advanced Materials, 17 (1995)

K. R. Thumma and D. N. Beshers, "Damping and acoustic harmonics in cracked laminated composites," Metall. Mater. Trans. A, 26A, 2825 (1995)

V. F. Coronel, D. N. Beshers, S. Catto, and F. S. Ryan, "Flux oscillations generated by vibration of iron at 22 kHz," J. Phys. Chem. Solids, 55 No. 12, 1521 (1994)

J. D. Mis, S. Madder, and D. N. Beshers, "Effects of a stress field on boron ion implantation damage in silicon," J. Appl. Phys., 74, 2294 (1993)

500 W. 120th St., Mudd 200, MC 4701 New York, NY 10027 / Phone: 212-854-4457 / Fax: 212-854-8257 / Email: seasinfo.apam@columbia.edu

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