I. Cevdet Noyan, Chair

APAM Chair and Professor of Materials Science and Engineering and of Earth and Environmental Engineering

Materials Science and Engineering
208 & 1120 S.W. Mudd
Mail Code: 4701
New York, NY 10027
Email: icn2@columbia.edu

Research Specialty

characterization and modeling of mechanical and micromechanical deformation; residual stress analysis and nondestructive testing; x-ray and neutron diffraction, microdiffraction analysis


Northwestern University, Materials Science & Eng, Ph.D. 1984


I. C. Noyan has been studying the mechanical response of crystalline materials over various length scales since 1978. He was one of the first researchers to combine the theory of micromechanics with that of x-ray and neutron diffraction. He and his group also work on extending x-ray characterization techniques for bulk structures to microdomains, with particular emphasis on ULSI chip structures. They have designed and built a microdiffraction system based on focussing capillary optics and monochromatic radiation on the X-20 beamline of the Brookhaven National Laboratory, National Synchrotron Light Source (NSLS). It was successfully used to determine the evolution of stress gradients in electromigration structures at very low current densities It was also used to analyze dislocation distributions and lattice rotations in SiGe films on a local scale. The microbeam effort is now being extended to the quantification of finite size effects in thin film structures, and is being pursued at NSLS and the Advanced, Photon Source. From 2005 on Noyan has been a Co-principal investigator on the new X13B microbeam diffraction line that is being built at NSLS. This beamline is now operational and will be fully commissioned in 2008.


Professional Experience

Columbia University, New York, NY

  • APAM Department Chair (July 2012 - Present)
  • Professor of Materials Science and Engineering (2004 - Present)
  • Adjunct Professor (1985 - 2004)

International Business Machines Corporation, Yorktown Heights, NY

  • Research Consultant (2004 - Present)
  • Research Staff Member (1985 - 2004)

Northwestern University, Evanston, IL

  • Postdoctoral Researcher (1983 - 1985)

Recent publications

Evolution of strain energy during recrystallization of plated Cu films, C. Murray, R. Rosenberg, C. Witt, M. Treger, and I. C. Noyan, J. Appl. Phys. 113, 203515, (2013)

Characterization of room temperature recrystallization kinetics in electroplated copper thin films with concurrent x-ray diffraction and electrical resistivity measurements, M. Treger, C. Witt, C. Cabral, C. Murray, J. Jordan-Sweet, R. Rosenberg, E. Eisenbraun, and I. C. Noyan, J. Appl. Phys. 113, 214904 (2013)

Optimization of growth conditions of type-II Zn(Cd)Te/ZnCdSe submonolayer quantum dot superlattices for intermediate band solar cells, S. Dhomkar, I. Kuskovsky, U. Manna, I.C. Noyan, M. Tamargo, Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 31:3:03C119,03C119-7 (2013)

Neutron Diffraction Measurement of Stress Redistribution in Parallel Seven-Wire Strands after Local Fracture, F. Mei, I. C. Noyan, A. Brügger, R. Betti, B. Clausen, D. Brown, T. Sisneros, Experimental Mechanics, 53:2:183-193 (2013)

Structural properties and spatial ordering in multilayered ZnMgTe/ZnSe type-II quantum dot structures, U. Manna, I.C. Noyan, Q. Zhang, I.F. Salakhutdinov, K.A. Dunn, S.W. Novak, R. Moug, M.C. Tamargo, G.F. Neumark, I.L. Kuskovsky, Journal of Applied Physics, 111:3: 033516, 033516-7 (2012)

Nanoscale silicon-on-insulator deformation induced by stressed liner structures, Conal E. Murray, A. Ying, S. M. Polvino, I. C. Noyan, M. Holt, and J. Maser, J. Appl. Phys. 109, 083543, (2011)

Measurement of Strain/Load Transfer in Parallel Seven-wire Strands with Neutron Diffraction, I. C. Noyan, A. Brügger, R. Betti and B. Clausen, Experimental Mechanics 50, 265-272, (2010)

Modeling of kinematic diffraction from a thin silicon film illuminated by a coherent, focused X-ray nanobeam, A. Ying, B. Osting, I. C. Noyan, C. E. Murray, M. Holt and J. Maser, J. Appl. Cryst. 43, 587-595, (2010)

Nanoscale strain characterization in microelectronic materials using X-ray diffraction, Conal E. Murray, A. J. Ying, S. M. Polvino, I. C. Noyan, Z. Cai, Journal: Powder Diffraction, Vol. 25, No. 2, (2010)

A rigorous comparison of X-ray diffraction thickness measurement techniques using silicon-on-insulator thin films, A. J. Ying, C. E. Murray and I. C. Noyan, J. Appl. Cryst. 42, 401ñ410, (2009)

Strain measured in a silicon-on-insulator, complementary metal-oxide-semiconductor device channel induced by embedded silicon-carbon source/drain regions, C. E. Murray, Z. Ren, A. Ying, S. M. Polvino, I. C. Noyan, and Z. Cai,
App. Phys. Lett. 94, 063502, (2009)

Applicability of real-space methods to diffraction strain measurements in single crystals, O. Kalenci and I. C. Noyan, J. Appl. Cryst. 944-949, (2008)

Submicron mapping of strained silicon-on-insulator features induced by shallow-trench-isolation structures. Conal E. Murray, M. Sankarapandian, S. M. Polvino, I. C. Noyan, B. Lai, and Z. Cai, Appl. Phys. Lett. 90, 171919, (2007)

Diffraction profiles of elastically bent single crystals with constant strain gradients, Hanfei Yan, Ozgur Kalenci and I. C. Noyan, Journal of Applied, Crystallography, 322-333, (2007)

Mapping local strain in thin film/substrate systems using x-ray microdiffraction topography, Hanfei Yan, Conal E. Murray, and I. C. Noyan, Appl. Phys. Lett. 90, 091918, (2007)

Dynamical diffraction peak splitting in time-of-flight neutron diffraction, E. Üstündag, R. A. Karnesky, M. R. Daymond, and I. C. Noyan, Appl. Phys. Lett. 89, 233515, (2006)

Measurement of stress/strain in single-crystal samples using diffraction, Yan, H. & Noyan, I. C.. J. Appl. Cryst. 39, 320–325, (2006)

Thermal stress evolution in embedded Cu/low-k dielectric composite features, Conal E. Murray, Charles C. Goldsmith, Thomas M. Shaw, James P. Doyle, and I. C. Noyan, Appl. Phys. Lett. 89, 011913, (2006).

Structure of Zn–Se–Te system with sub-monolayer insertion of ZnTe grown by migration enhanced epitaxy, Y. Gong, Hanfei F. Yan, I. L. Kuskovsky, Y. Gu, I. C. Noyan, G. F. Neumark, and M. C. Tamargo, J. Appl. Phys. 99, 064913, (2006)

Mechanism for increasing dopant incorporation in semiconductors via doped nanostructures, Igor L. Kuskovsky, Y. Gu, 2, Y. Gong, H. F. Yan, J. Lau, I. C. Noyan, G. F. Neumark, O. Maksimov, X. Zhou, M. C. Tamargo, V. Volkov, Y. Zhu, and L. Wang, Phys. Rev. B 73, 195306, (2006)

Dynamical diffraction artifacts in Laue microdiffraction images, H.F Yan and I.C. Noyan, J. App. Phys. 98 (7), (2005)

Mechanics of end effects in thin film and substrate stress distributions, C.E. Murray and I.C. Noyan, Mat. Sci. Forum 490-491: 13-18, (2005)

Flexural loading of rectangular Si beams and plates, S.K. Kaldor, I.C. Noyan, Mat. Sci. & Eng., A- 399, (1-2): 64-71, (2005)

Spatially transient stress effects in thin films by X-ray diffraction, C.E. Murray, C.C. Goldsmith, I.C. Noyan, Power Difraction, 20 (2): 112-116, (2005)

Fourier analysis of X-ray micro-diffraction profiles to characterize laser shock peened metals, H.Q. Chen, Y.L. Yao, J.W. Kysar, I.C. Noyan, Y.N. Wang, Int. J. Solids and Structures, 42 (11-12): 3471-3485, (2005)

High-resolution strain mapping in heteroepitaxial thin-film features, C.E. Murray, H.F. Yan, I.C. Noyan, Z. Cai, B. Lai, J. App. Phys. 98 (1), (2005)

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